Prediction of Digital Circuit Board Reliability Using Computational Reliability Modeling
A process called computational reliability modeling is described herein as well as how the reliability predictions from this
modeling approach match experimental data (both lead and lead-free s
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Event
IPC APEX EXPO 2006
A Proposed Mechanism and Remedy for Ball-in-Socket and Foot-in-Mud Soldering Defects on Ball Grid Array and Quad Flat Pack Components
A common source of defects on area array components is the “ball-in-socket” (or “pillowhead”) defect. This defect is
defined as one or more connections that show physical contact but no wetting
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Event
IPC APEX EXPO 2006
Effect of Voiding on Solder Joint Shock and Thermal Cycle Reliability
Solder joint void has been considered a typical phenomenon in electronics assembly. Voids are caused by entrapped gases
produced during flux volatilization during SMT,air entrapment in plated t
.. read more
Event
IPC APEX EXPO 2006
Building Reliability into the PWB: Optimization of the Desmear and Metalization Processes for Use on High Frequency and Lead Free Laminate Materials
High Frequency and Lead-Free laminate materials are finding increased use in the PWB fabrication industry driven by end
user requirements for high-speed signal transmission and lead-free solder
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Event
IPC APEX EXPO 2006
Peelable Solder Masks – New Formulations for Today’s Challenges
When manufacturing printed wiring boards and assemblies it is often necessary to cover certain areas prior to soldering operations in order to avoid them being wetted with solder. Such areas ma
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Event
IPC APEX EXPO 2006
Desmear and Plating Through Hole Considerations and Experiences for Green PCB Production
With the latest legislations from RoHS and WEEE dominating the horizon of the PCB landscape there is a need for
manufacturers and their suppliers to understand their impacts. The requirement to
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Event
IPC APEX EXPO 2006
Production Experience and Performance Characterization of a Novel Immersion Silver
Following previous reports by the authors on the general properties of a novel immersion silver process,this paper presents
the production experience in typical horizontal lines to demonstrate
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Event
IPC APEX EXPO 2006
The Flash Gold Surface Finish Technology
The advent of surface mount technology and now the lead free issue have ushered in a new wave of solderability treatments,
in particular the flat hard metal finishes. Among others these include
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Event
IPC APEX EXPO 2006
The Characterization of Novel High Temperature Resistant OSP Coatings for Lead free Processes by Comparing to Other Commercial OSP Coatings
In order to meet the growing requirement of eliminating lead from electronics,the printed wiring board (PWB) industry is
migrating from hot-air-leveled solder (Sn/Pb) to lead free compatible al
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Event
IPC APEX EXPO 2006
Effect of Surface Finish,Reflow Profile and High Temperature Aging on Drop Test Reliability of Lead Free CSPs
Chip scale packages (CSPs) are widely used in portable electronic products. Mechanical drop testing is a critical reliability
requirement for these products. With the switch to lead free solder
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Event
IPC APEX EXPO 2006
A Comparison of the Isothermal Fatigue Behavior of Sn-Ag-Cu to Sn-Pb Solder
The movement to Pb-free soldering will result in solder joints that are significantly stiffer than those made of SnPb. This
paper presents the results from the first phase of a two-part study t
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Event
IPC APEX EXPO 2006
Backward Compatibility Study of Lead Free Area Array Packages with Tin-Lead Soldering Process
In response to RoHS and other international environmental legislation,the semiconductor industry is moving toward the
elimination of lead (Pb) from packages. During the transitional period,both
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Event
IPC APEX EXPO 2006
First Article Inspection Strategies
In these days of high mix low volume there is increasing pressure on the SMT departments of manufacturing companies to
reduce changeover times and increase machinery utilization. An enormous ef
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Event
IPC APEX EXPO 2006
What to Consider when Designing a Universal Test Strategy Tool
Selecting an optimal test strategy is a complex task today. There are many test inspection and test methods available. The
most common choices to find manufacturing defects on printed circuit b
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Event
IPC APEX EXPO 2006
Concurrent Testing: Increasing Test Coverage without Affecting Cycle Time
Volume electronic manufacturing environments are constantly seeking solutions to bottlenecks at end-of-line test.
Bottlenecks are being seen increasingly on high volume automotive,telecomm & co
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Event
IPC APEX EXPO 2006
Predicting Plated Through Hole Life at Assembly and in the Field from Thermal Stress Data
Over the past ten years,two new test methods: Interconnect Stress Test [1] and Highly Accelerated Thermal Shock [2] have
been developed to perform thermal cycling testing and in particular,to m
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Event
IPC APEX EXPO 2006
IMC Growth Study on Ni-P/Pd/Au Film and Ni-P/Au Film Using Sn/Ag/Cu Lead Free Solder
The surface finishes Ni-P/Pd/Au (hereafter referred to ENEPIG) and Ni-P/Au (hereafter referred to ENIG) were
prepared on ball grid array (BGA) circuit boards by electroless/immersion plating me
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Event
IPC APEX EXPO 2006
Thermal Stress Testing & Impact of High Thermal Excursion Pre-Conditioning on Cycles to Fail
Today both Interconnect Stress Test (IST) and Highly Accelerated Thermal Shock (HATS) test methods are used to measure
plated through hole via reliability. Both of these test methods have prove
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Event
IPC APEX EXPO 2006
Measles in Advanced Technology
Continuous measling,or unidirectional crazing,was observed in a multi-layer polyimide printed wiring board following
assembly operations. Damage to the PWB preferentially followed the warp dire
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Event
IPC APEX EXPO 2006
Electrodeposited Nanocrystalline Copper for Printed Wiring Board Applications
Nanocrystalline and ultra-fine grain copper can potentially offer increased reliability and functionality of printed wiring
boards due to expected enhancements in strength and achievable wiring
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Event
IPC APEX EXPO 2006
The Effect of Plating Cell Configuration on the Quality of Copper Deposit for Printed Circuit Boards
This paper addresses the effect of pulse plating of electronic interconnects for advanced electronic modules. This paper
builds on earlier work by correlating plating cell and tank design issue
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Event
IPC APEX EXPO 2006
Assessing the Reliability of New Connector Designs
With the combination of increased product complexity,increased frequencies and ever decreasing component sizes and
pitches designers are faced with the dilemma on how design their products in t
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Event
IPC APEX EXPO 2006
Going Beyond - ACHIEVING HIGH Accuracy Placement in a Volume Application
The constant drive by designers to create more functionally unique products has challenged the assembly community for
some time. As a result,many processes have been developed under the “Necess
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Event
IPC APEX EXPO 2006
Impact of Lead Contamination on Reliability of Lead Free Alloys
Meeting the RoHS directive will require the transition from the historical tin-lead based system of materials to one that
does not contain lead. This is of course is not straight forward as it
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Event
IPC APEX EXPO 2006
New Lead Free Solder Composition and Physical Properties of Printed Wiring Board Laminate Material To Suppress Lift-Off and Improve Reliability
Lift-off (fillet-lifting) and land-lifting phenomena,which occur in wave soldering with Sn-Ag-Cu (SAC) solders,depend
on the physical properties of the solder and the laminate material used. A
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Event
IPC APEX EXPO 2006
Effect of Reflow Profile on SnPb and SnAgCu Solder Joint Shear Force
Reflow profile has significant impact on solder joint performance because it influences wetting and microstructure of the
solder joint. The degree of wetting,the microstructure (in particular t
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Event
IPC APEX EXPO 2006
In-Circuit Test Probe Contact on Lead Free Printed Circuit Board Assemblies
The in-circuit test (ICT) of printed circuit boards (PCBs) assembled with Lead Free solder was anticipated to be problematic
by industry test engineers,due to contact failures associated with t
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Event
IPC APEX EXPO 2006
Process Qualification Using the IPC-B-52 Standard Test Assembly
Many professionals in the electronics manufacturing industry have,or eventually will,face the issue of determining
whether the materials of construction for printed wiring assemblies (PWAs) are
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Event
IPC APEX EXPO 2006
Reliability Tests of Lead Free Solder Joints
Reliability of RoHS compliant products is investigated in this study. Emphasis is placed on the lead free solder joint
reliability. Solder is the electrical and mechanical “glue” of electronics
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Event
IPC APEX EXPO 2006
RoHS Substance Thresholds,Facts and Friction
Meeting RoHS requirements is confusing at best. Currently,RoHS bans the presence of 6 substances,: Lead (Pb),Cadmium (Cd),Mercury (Hg),Hexavalent Chromium (Cr6+),Polybrominated biphenyl (PBB) a
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Event
IPC Fall Meetings 2005
Utilizing 3D Package Technology for Complex SiP Applications - Innovative Solutions for System Level Integration and Miniaturization
Hand-held communication and entertainment products continue to dominate the consumer markets worldwide,and with each
generation,companies are offering more and more features and/or capability.
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Event
IPC APEX EXPO 2005
Thermoplastic Injection Molding: New Packages and 3D Circuits
Thermoset epoxies,discovered nearly 80 years ago,remain the workhorse materials for electronic packaging and printed
circuit boards,but this may change with increasing technical,economic and re
.. read more
Event
IPC APEX EXPO 2005
Flip Chip Assembly of Thinned Silicon Die on Flex Substrates
The assembly of thinned silicon die (25-100µm) onto flex substrates provides options for ultra thin,flexible electronics for
applications ranging from smart cards to space-based radars. For hig
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Event
IPC APEX EXPO 2005
Higher Reliability “Oriented” Plastic Packages
Plastic IC Packages are generally considered to be not as reliable as their ceramic counterparts. One of the major reasons is
the question of hermeticity. Plastic materials generally allow mois
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Event
IPC APEX EXPO 2005
Reliability of CCGA and PBGA Assemblies
Area Array Packages (AAPs) with 1.27 mm pitch have been the packages of choice for commercial applications; they are now
starting to be implemented for use in military and aerospace application
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Event
IPC APEX EXPO 2005
Conductive Anodic Filament (CAF) Formation: An Historic Perspective
Conductive Anodic Filament (CAF) is a failure mode in printed wiring boards (PWBs) which occurs under high humidity and
high voltage gradient conditions. The filament,a copper salt,grows from a
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Event
IPC APEX EXPO 2005
Chinese PCB Industry and the Association
The Chinese printed circuit industry has seen rapid growth in the past years,from barely nothing to more than 6.05 billion
USD production value in 2003. The association of the industry,CPCA,als
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Event
IPC APEX EXPO 2005
Material Declaration: Joint Industry Guide on Materials Joint Industry Guide on Materials
Event
IPC Fall Meetings 2005
Implementing a System for the Collection and Management of IPC-1752 Standards- Based Material Declarations
Event
IPC Fall Meetings 2005
Material Declarations: Risky Business - Perspectives from your Supply Base
Component Material Declarations are a key building block for all OEMs (Original Equipment Manufacturer) and CMs (Contract Manufacturer) preparing a sound due diligence case for RoHS Compliance.
.. read more
Event
IPC Fall Meetings 2005
Implementing a Successful Compliance Program for the EU's RoHS and WEEE Directives: Disclosure Levels,Roadblocks and Lessoned Learned
As the electronics industry prepares for the elimination of the six chemical substances banned by the European Union’s Restriction of the Use of Certain Hazardous Substances in Electrical and E
.. read more
Event
IPC Fall Meetings 2005
Procedures for the Determination of Levels of Six Regulated Substances (Lead,Mercury,Cadmium,Hexavalent Chromium,Polybrominated Biphenyls,Polybrominated Biphenyl Ether) in Electrotechnical Products
The widespread use of electrotechnical products has drawn increased attention to their impact on the environment. In many countries all over the world this has resulted in the adaptation of reg
.. read more
Event
IPC Fall Meetings 2005
Design for Environment Needs a Collaborative Approach
Event
IPC Fall Meetings 2005
Building an Effective Hazardous Materials Compliance System: Managing RoHS,WEEE and Other Regulations
In response to growing concerns about the effects of hazardous materials in the waste stream on the environment,the European Union (EU) passed a directive in 2002 entitled the Restriction of th
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Event
IPC Fall Meetings 2005
On Solder Joints Reliability and Component Damage of Hand Soldered Lead-Free PTH and SMD Components
Due to the European legislations (RoHS and WEEE) consumer products need to be soldered with lead-free solders from the first of July 2006. Since several properties (physical,chemical,mechanical
.. read more
Event
IPC Fall Meetings 2005
A Study of Implementing Lead free Soldering Process with Organic Solderability Preservative Coating In a High Volume Production Environment
As the global electronic industry marches toward the brave new world of environmentally conscious electronic manufacturing,lead free soldering has made some fundamental shifts in the processing
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Event
IPC Fall Meetings 2005
LEAD LEAD-FREE ELECTROLESS NICKEL FOR ENIG
Event
IPC Fall Meetings 2005
Nickel-Palladium-Gold: A Cost Effective,Sn-Whisker-Free Termination Finish
Event
IPC Fall Meetings 2005
Dynamics in Lead-Free Wave Soldering
The following report is fundamentally focused on how three popular lead-free alloys react in a wave solder application. The alloys were SAC305,SAC405 and a proprietary,low silver SAC alloy. In
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Event
IPC Fall Meetings 2005
Microvia Reliability Concerns in the Lead Free Assembly Environment
Traditionally microvias have been considered to be the most reliable interconnect structure within a printed wiring board (PWB). With the advent of lead free assembly the vulnerability of high
.. read more
Event
IPC Fall Meetings 2005