Welcome to IPC's collection of technical papers presented at conferences since 2002. You can search by author, title and keyword. You can also search for keywords and topics in the Tag field. Access to the papers is reserved for IPC members.

Prediction of Digital Circuit Board Reliability Using Computational Reliability Modeling

A process called computational reliability modeling is described herein as well as how the reliability predictions from this modeling approach match experimental data (both lead and lead-free s .. read more
Author(s)
Loren Nasser,Robert Tryon
Event
IPC APEX EXPO 2006

A Proposed Mechanism and Remedy for Ball-in-Socket and Foot-in-Mud Soldering Defects on Ball Grid Array and Quad Flat Pack Components

A common source of defects on area array components is the “ball-in-socket” (or “pillowhead”) defect. This defect is defined as one or more connections that show physical contact but no wetting .. read more
Author(s)
Brian Smith
Event
IPC APEX EXPO 2006

Effect of Voiding on Solder Joint Shock and Thermal Cycle Reliability

Solder joint void has been considered a typical phenomenon in electronics assembly. Voids are caused by entrapped gases produced during flux volatilization during SMT,air entrapment in plated t .. read more
Author(s)
Donghyun Kim,Ken Hubbard,Bala Nandagopal,Mason Hu,Sue Teng,Ali Nouri
Event
IPC APEX EXPO 2006

Building Reliability into the PWB: Optimization of the Desmear and Metalization Processes for Use on High Frequency and Lead Free Laminate Materials

High Frequency and Lead-Free laminate materials are finding increased use in the PWB fabrication industry driven by end user requirements for high-speed signal transmission and lead-free solder .. read more
Author(s)
Michael Carano,Lee Burger
Event
IPC APEX EXPO 2006

Peelable Solder Masks – New Formulations for Today’s Challenges

When manufacturing printed wiring boards and assemblies it is often necessary to cover certain areas prior to soldering operations in order to avoid them being wetted with solder. Such areas ma .. read more
Author(s)
Sven E. Kramer
Event
IPC APEX EXPO 2006

Desmear and Plating Through Hole Considerations and Experiences for Green PCB Production

With the latest legislations from RoHS and WEEE dominating the horizon of the PCB landscape there is a need for manufacturers and their suppliers to understand their impacts. The requirement to .. read more
Author(s)
Neil Patton
Event
IPC APEX EXPO 2006

Production Experience and Performance Characterization of a Novel Immersion Silver

Following previous reports by the authors on the general properties of a novel immersion silver process,this paper presents the production experience in typical horizontal lines to demonstrate .. read more
Author(s)
Y-H. Yau,C. Fan,L. Guan,X. Xiao,R. Tam,K. Wengenroth,J. Abys,M. Nagakura,T. Sasaki,S. Kiuchi,H. Kumagai,A. Toda
Event
IPC APEX EXPO 2006

The Flash Gold Surface Finish Technology

The advent of surface mount technology and now the lead free issue have ushered in a new wave of solderability treatments, in particular the flat hard metal finishes. Among others these include .. read more
Author(s)
J. Lee Parker,Urmi Ray,Li Tong Lin
Event
IPC APEX EXPO 2006

The Characterization of Novel High Temperature Resistant OSP Coatings for Lead free Processes by Comparing to Other Commercial OSP Coatings

In order to meet the growing requirement of eliminating lead from electronics,the printed wiring board (PWB) industry is migrating from hot-air-leveled solder (Sn/Pb) to lead free compatible al .. read more
Author(s)
Shenliang Sun,Yung-Herng Yau,John Fudala,Robert Farrell,Chonglun Fan,Chen Xu,Karl Wengenroth,Michael Cheung and Joseph Abys
Event
IPC APEX EXPO 2006

Effect of Surface Finish,Reflow Profile and High Temperature Aging on Drop Test Reliability of Lead Free CSPs

Chip scale packages (CSPs) are widely used in portable electronic products. Mechanical drop testing is a critical reliability requirement for these products. With the switch to lead free solder .. read more
Author(s)
Yueli Liu,Shyam Gale,Tameika Burts,R. Wayne Johnson
Event
IPC APEX EXPO 2006

A Comparison of the Isothermal Fatigue Behavior of Sn-Ag-Cu to Sn-Pb Solder

The movement to Pb-free soldering will result in solder joints that are significantly stiffer than those made of SnPb. This paper presents the results from the first phase of a two-part study t .. read more
Author(s)
Nathan Blattau,Craig Hillman
Event
IPC APEX EXPO 2006

Backward Compatibility Study of Lead Free Area Array Packages with Tin-Lead Soldering Process

In response to RoHS and other international environmental legislation,the semiconductor industry is moving toward the elimination of lead (Pb) from packages. During the transitional period,both .. read more
Author(s)
Jennifer Nguyen,David Geiger,Daniel Rooney,Dongkai Shangguan
Event
IPC APEX EXPO 2006

First Article Inspection Strategies

In these days of high mix low volume there is increasing pressure on the SMT departments of manufacturing companies to reduce changeover times and increase machinery utilization. An enormous ef .. read more
Author(s)
Greg Ross
Event
IPC APEX EXPO 2006

What to Consider when Designing a Universal Test Strategy Tool

Selecting an optimal test strategy is a complex task today. There are many test inspection and test methods available. The most common choices to find manufacturing defects on printed circuit b .. read more
Author(s)
Stig Oresjo
Event
IPC APEX EXPO 2006

Concurrent Testing: Increasing Test Coverage without Affecting Cycle Time

Volume electronic manufacturing environments are constantly seeking solutions to bottlenecks at end-of-line test. Bottlenecks are being seen increasingly on high volume automotive,telecomm & co .. read more
Author(s)
Hans Baka,Grant Boctor
Event
IPC APEX EXPO 2006

Predicting Plated Through Hole Life at Assembly and in the Field from Thermal Stress Data

Over the past ten years,two new test methods: Interconnect Stress Test [1] and Highly Accelerated Thermal Shock [2] have been developed to perform thermal cycling testing and in particular,to m .. read more
Author(s)
Michael Freda,Donald Barker
Event
IPC APEX EXPO 2006

IMC Growth Study on Ni-P/Pd/Au Film and Ni-P/Au Film Using Sn/Ag/Cu Lead Free Solder

The surface finishes Ni-P/Pd/Au (hereafter referred to ENEPIG) and Ni-P/Au (hereafter referred to ENIG) were prepared on ball grid array (BGA) circuit boards by electroless/immersion plating me .. read more
Author(s)
Yukinori Oda,Masayuki Kiso,Shigeo Hashimoto,George Milad,Donald Gudeczauskas
Event
IPC APEX EXPO 2006

Thermal Stress Testing & Impact of High Thermal Excursion Pre-Conditioning on Cycles to Fail

Today both Interconnect Stress Test (IST) and Highly Accelerated Thermal Shock (HATS) test methods are used to measure plated through hole via reliability. Both of these test methods have prove .. read more
Author(s)
Karl Sauter
Event
IPC APEX EXPO 2006

Measles in Advanced Technology

Continuous measling,or unidirectional crazing,was observed in a multi-layer polyimide printed wiring board following assembly operations. Damage to the PWB preferentially followed the warp dire .. read more
Author(s)
Michael Vernoy,Wennei Chen,Bruce Dall,Mahendra Gandhi
Event
IPC APEX EXPO 2006

Electrodeposited Nanocrystalline Copper for Printed Wiring Board Applications

Nanocrystalline and ultra-fine grain copper can potentially offer increased reliability and functionality of printed wiring boards due to expected enhancements in strength and achievable wiring .. read more
Author(s)
Patrick Woo,Uwe Erb
Event
IPC APEX EXPO 2006

The Effect of Plating Cell Configuration on the Quality of Copper Deposit for Printed Circuit Boards

This paper addresses the effect of pulse plating of electronic interconnects for advanced electronic modules. This paper builds on earlier work by correlating plating cell and tank design issue .. read more
Author(s)
H. Garich,J. Sun,L. Gebhart,M. Inman,E.J. Taylor,T. Dalrymple,N. Emami,R. Smith,T. Berg,R. Thompson and W. Richards
Event
IPC APEX EXPO 2006

Assessing the Reliability of New Connector Designs

With the combination of increased product complexity,increased frequencies and ever decreasing component sizes and pitches designers are faced with the dilemma on how design their products in t .. read more
Author(s)
Heather McCormick and George Riccitelli
Event
IPC APEX EXPO 2006

Going Beyond - ACHIEVING HIGH Accuracy Placement in a Volume Application

The constant drive by designers to create more functionally unique products has challenged the assembly community for some time. As a result,many processes have been developed under the “Necess .. read more
Author(s)
L. Todd Woods,Mike Yingling,Jacques Coderre
Event
IPC APEX EXPO 2006

Impact of Lead Contamination on Reliability of Lead Free Alloys

Meeting the RoHS directive will require the transition from the historical tin-lead based system of materials to one that does not contain lead. This is of course is not straight forward as it .. read more
Author(s)
Christopher Hunt,Martin Wickham
Event
IPC APEX EXPO 2006

New Lead Free Solder Composition and Physical Properties of Printed Wiring Board Laminate Material To Suppress Lift-Off and Improve Reliability

Lift-off (fillet-lifting) and land-lifting phenomena,which occur in wave soldering with Sn-Ag-Cu (SAC) solders,depend on the physical properties of the solder and the laminate material used. A .. read more
Author(s)
Kenichi Ikeda,Hideki Ishihara,Hirohiko Watanabe,Tatsuhiko Asai,Hiroaki Hokazono,Ikuo Shohji
Event
IPC APEX EXPO 2006

Effect of Reflow Profile on SnPb and SnAgCu Solder Joint Shear Force

Reflow profile has significant impact on solder joint performance because it influences wetting and microstructure of the solder joint. The degree of wetting,the microstructure (in particular t .. read more
Author(s)
Jianbiao Pan,Tzu-Chien Chou,Wesley J. Dee,Brian J. Toleno
Event
IPC APEX EXPO 2006

In-Circuit Test Probe Contact on Lead Free Printed Circuit Board Assemblies

The in-circuit test (ICT) of printed circuit boards (PCBs) assembled with Lead Free solder was anticipated to be problematic by industry test engineers,due to contact failures associated with t .. read more
Author(s)
Cyril Cooper
Event
IPC APEX EXPO 2006

Process Qualification Using the IPC-B-52 Standard Test Assembly

Many professionals in the electronics manufacturing industry have,or eventually will,face the issue of determining whether the materials of construction for printed wiring assemblies (PWAs) are .. read more
Author(s)
Douglas Pauls,Courtney Slach,Nathan Devore
Event
IPC APEX EXPO 2006

Reliability Tests of Lead Free Solder Joints

Reliability of RoHS compliant products is investigated in this study. Emphasis is placed on the lead free solder joint reliability. Solder is the electrical and mechanical “glue” of electronics .. read more
Author(s)
John H. Lau
Event
IPC APEX EXPO 2006

RoHS Substance Thresholds,Facts and Friction

Meeting RoHS requirements is confusing at best. Currently,RoHS bans the presence of 6 substances,: Lead (Pb),Cadmium (Cd),Mercury (Hg),Hexavalent Chromium (Cr6+),Polybrominated biphenyl (PBB) a .. read more
Author(s)
Mark Frimann
Event
IPC Fall Meetings 2005

Utilizing 3D Package Technology for Complex SiP Applications - Innovative Solutions for System Level Integration and Miniaturization

Hand-held communication and entertainment products continue to dominate the consumer markets worldwide,and with each generation,companies are offering more and more features and/or capability. .. read more
Author(s)
Vern Solberg
Event
IPC APEX EXPO 2005

Thermoplastic Injection Molding: New Packages and 3D Circuits

Thermoset epoxies,discovered nearly 80 years ago,remain the workhorse materials for electronic packaging and printed circuit boards,but this may change with increasing technical,economic and re .. read more
Author(s)
Ken Gilleo,Dennis Jones,Gerald Pham-Van-Diep
Event
IPC APEX EXPO 2005

Flip Chip Assembly of Thinned Silicon Die on Flex Substrates

The assembly of thinned silicon die (25-100µm) onto flex substrates provides options for ultra thin,flexible electronics for applications ranging from smart cards to space-based radars. For hig .. read more
Author(s)
Tan Zhang,Zhenwei Hou,R. Wayne Johnson,Alina Moussessian,Linda Del Castillo,Charles Banda
Event
IPC APEX EXPO 2005

Higher Reliability “Oriented” Plastic Packages

Plastic IC Packages are generally considered to be not as reliable as their ceramic counterparts. One of the major reasons is the question of hermeticity. Plastic materials generally allow mois .. read more
Author(s)
Gabe Cherian
Event
IPC APEX EXPO 2005

Reliability of CCGA and PBGA Assemblies

Area Array Packages (AAPs) with 1.27 mm pitch have been the packages of choice for commercial applications; they are now starting to be implemented for use in military and aerospace application .. read more
Author(s)
Reza Ghaffarian,Ph.D
Event
IPC APEX EXPO 2005

Conductive Anodic Filament (CAF) Formation: An Historic Perspective

Conductive Anodic Filament (CAF) is a failure mode in printed wiring boards (PWBs) which occurs under high humidity and high voltage gradient conditions. The filament,a copper salt,grows from a .. read more
Author(s)
Laura J. Turbini
Event
IPC APEX EXPO 2005

Chinese PCB Industry and the Association

The Chinese printed circuit industry has seen rapid growth in the past years,from barely nothing to more than 6.05 billion USD production value in 2003. The association of the industry,CPCA,als .. read more
Author(s)
Wang Longji
Event
IPC APEX EXPO 2005

Material Declarations: Risky Business - Perspectives from your Supply Base

Component Material Declarations are a key building block for all OEMs (Original Equipment Manufacturer) and CMs (Contract Manufacturer) preparing a sound due diligence case for RoHS Compliance. .. read more
Author(s)
M. Carter Berrios,A. Offner
Event
IPC Fall Meetings 2005

Implementing a Successful Compliance Program for the EU's RoHS and WEEE Directives: Disclosure Levels,Roadblocks and Lessoned Learned

As the electronics industry prepares for the elimination of the six chemical substances banned by the European Union’s Restriction of the Use of Certain Hazardous Substances in Electrical and E .. read more
Author(s)
Chris Harden
Event
IPC Fall Meetings 2005

Procedures for the Determination of Levels of Six Regulated Substances (Lead,Mercury,Cadmium,Hexavalent Chromium,Polybrominated Biphenyls,Polybrominated Biphenyl Ether) in Electrotechnical Products

The widespread use of electrotechnical products has drawn increased attention to their impact on the environment. In many countries all over the world this has resulted in the adaptation of reg .. read more
Author(s)
Markus Stutz,Michael Loch,Scott O'Connell
Event
IPC Fall Meetings 2005

Building an Effective Hazardous Materials Compliance System: Managing RoHS,WEEE and Other Regulations

In response to growing concerns about the effects of hazardous materials in the waste stream on the environment,the European Union (EU) passed a directive in 2002 entitled the Restriction of th .. read more
Author(s)
Josef Kroog,Mark Strandquest
Event
IPC Fall Meetings 2005

On Solder Joints Reliability and Component Damage of Hand Soldered Lead-Free PTH and SMD Components

Due to the European legislations (RoHS and WEEE) consumer products need to be soldered with lead-free solders from the first of July 2006. Since several properties (physical,chemical,mechanical .. read more
Author(s)
M.H. Biglari,S.E. Geuzebroek,C. van Ochten,M. Biglari Jr.,J. Iven,G. Gerrits,A.A. Kodentsov,E. Peekstok
Event
IPC Fall Meetings 2005

A Study of Implementing Lead free Soldering Process with Organic Solderability Preservative Coating In a High Volume Production Environment

As the global electronic industry marches toward the brave new world of environmentally conscious electronic manufacturing,lead free soldering has made some fundamental shifts in the processing .. read more
Author(s)
Michael Yuen,Rockey Q. Luo
Event
IPC Fall Meetings 2005

LEAD LEAD-FREE ELECTROLESS NICKEL FOR ENIG

Author(s)
Michael Walsh
Event
IPC Fall Meetings 2005

Dynamics in Lead-Free Wave Soldering

The following report is fundamentally focused on how three popular lead-free alloys react in a wave solder application. The alloys were SAC305,SAC405 and a proprietary,low silver SAC alloy. In .. read more
Author(s)
Richard A. Szymanowski,D. Casati,E. Saglia,P. Lotosky,K. Howell,G. Hueste
Event
IPC Fall Meetings 2005

Microvia Reliability Concerns in the Lead Free Assembly Environment

Traditionally microvias have been considered to be the most reliable interconnect structure within a printed wiring board (PWB). With the advent of lead free assembly the vulnerability of high .. read more
Author(s)
Paul Andrews,Gareth Parry,Paul Reid
Event
IPC Fall Meetings 2005